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Information technology. Security techniques. Guide for the production of protection profiles and security targets
Document status: Replaced by GOST R 57628-2017
Semiconductor diodes. Measuring methods for electrical parameters. General requirements
Document status: Active
Integrated microcircuits. Methods for measuring delay time of the switching on/off the voltage comparators
Document status: Active
Fibre-optic, radio-relay and satellite main channels of digital TV signals transmission systems. Basic parameters and methods of measuring
Document status: Active
Reprography. Micrography. Microforms for technical documents. General requirements and standards
Document status: Active
Reprography. Micrography. Cards with picture aperture. General specifications
Document status: Active