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GOST 18986.7-73

Semiconductor diodes. Methods for measuring life time

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GOST R 53532-2009

Quality of Services. Parameters of Quality for Telecommunications Services in the Public Switched Telephone Network. General requirements

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GOST R ISO/IEC 10165-4-2001

Information technology. Open systems interconnection. Structure of management information. Guidelines for the definition of managed objects

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GOST R ISO 9040-96

Information technology. Open systems interconnection. Virtual terminal Basic Class Service

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GOST ISO/IEC 7812-1-2014

Identification cards. Identification of issuers. Part 1. Numbering system

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GOST 20398.8-74

Field-effect transistors. Drain current for v(gs)=0 measurement technique

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