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Semiconductor devices - Scan based ageing level estimation for semiconductor devices. IEC TR 63133:2017-10(en). Original standard IEC TR 63133-2017 in PDF full version. Additional info + preview on request

Document status: Active

Explanation of the mathematical addition of working voltages, insulation between circuits and use of PELV in TC 34 standards. Original standard IEC TR 63139-2018 in PDF full version. Additional info + preview on request

Document status: Replaced by St IEC TR 63139-2026

Damp heat, steady state (unsaturated pressurized vapour with air). IEC TR 63141:2020-04(en). Original standard IEC TR 63141-2020 in PDF full version. Additional info + preview on request

Document status: Active

Eyewear display - Part 1-1- Generic introduction. IEC TR 63145-1-1:2018-09(en). Original standard IEC TR 63145-1-1-2018 in PDF full version. Additional info + preview on request

Document status: Active

Land usage of photovoltaic (PV) farms - Mathematical models and calculation examples. IEC TR 63149:2018-08(en). Original standard IEC TR 63149-2018 in PDF full version. Additional info + preview on request

Document status: Withdrawn

Equipment for general lighting purposes - Objective test method for stroboscopic effects of lighting equipment. IEC TR 63158:2018-03(en). Original standard IEC TR 63158-2018 in PDF full version. Additional info + preview on request

Document status: Active