STM PDF

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation. Original standard IEC 60749-17-2003 in PDF full version. Additional info + preview on request

Document status: Replaced by St IEC 60749-17-2019

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose). Original standard IEC 60749-18-2002 in PDF full version. Additional info + preview on request

Document status: Replaced by St IEC 60749-18-2019

Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat. Original standard IEC 60749-20-1-2009 in PDF full version. Additional info + preview on request

Document status: Replaced by St IEC 60749-20-1-2019

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat. Original standard IEC 60749-20-2008 in PDF full version. Additional info + preview on request

Document status: Replaced by St IEC 60749-20-2020

Semiconductor devices - Mechanical and climatic test methods. Original standard IEC 60749-2002 in PDF full version. Additional info + preview on request

Document status: Replaced by

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level. Original standard IEC 60749-28-2017 in PDF full version. Additional info + preview on request

Document status: Replaced by St IEC 60749-28-2022