STM PDF

Test Method for Measuring Diameter of Semiconductor Wafers (Withdrawn 2001). Original standard ASTM F613-93 in PDF full version. Additional info + preview on request

Document status: Withdrawn

Test Method for Distortion of Optical Lenses Used in Photomask Fabrication. Original standard ASTM F614-80 (1991)e1 in PDF full version. Additional info + preview on request

Document status: Replaced by

Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric) (Withdrawn 2022). Original standard ASTM F615M-95 (2013) in PDF full version. Additional info + preview on request

Document status: Withdrawn

Standard Test Method for Measuring MOSFET Drain Leakage Current (Metric) (Withdrawn 2009). Original standard ASTM F616M-96 (2003) in PDF full version. Additional info + preview on request

Document status: Withdrawn

Standard Test Method for Measuring MOSFET Linear Threshold Voltage (Withdrawn 2006). Original standard ASTM F617-00 in PDF full version. Additional info + preview on request

Document status: Withdrawn

Standard Test Method for Measuring MOSFET Linear Threshold Voltage [Metric]. Original standard ASTM F617M-95 in PDF full version. Additional info + preview on request

Document status: Active