IEC 60749-22-2002 PDF
Name in English:
St IEC 60749-22-2002
Name in Russian:
Ст IEC 60749-22-2002
Description in English:
Semiconductor devices - Mechanical and climatic test methods - Part 22- Bond strength. CEI/IEC 60749-22:2002. Original standard IEC 60749-22-2002 in PDF full version. Additional info + preview on request
Description in Russian:
Полупроводниковые приборы - Методы механических и климатических испытаний - Часть 22- Прочность связи. CEI/IEC 60749-22:2002. Оригинальный стандарт IEC 60749-22-2002 в PDF полная версия. Дополнительная инфо + превью по запросу
Document status:
Replaced by
St IEC 60749-22-1-2025
, St IEC 60749-22-2-2025
Format:
Electronic (PDF)
Page count:
50
Delivery time (for English version):
1 business day
Delivery time (for Russian version):
5 business days
SKU:
stiec03188
More technical details are being prepared for this document.