IEEE Std 300-1988 (2006) PDF
Name in English:
St IEEE Std 300-1988 (2006)
Name in Russian:
Ст IEEE Std 300-1988 (2006)
Description in English:
IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors Original standard IEEE Std 300-1988 (2006) in PDF full version. Additional info + preview on request
Description in Russian:
Стандартные процедуры испытаний IEEE полупроводниковых детекторов заряженных частиц Оригинальный стандарт IEEE Std 300-1988 (2006) в PDF полная версия. Дополнительная инфо + превью по запросу
Document status:
Withdrawn
Format:
Electronic (PDF)
Page count:
35
Delivery time (for English version):
1 business day
Delivery time (for Russian version):
3 business days
SKU:
stieee000508
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