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VME bus extensions for instrumentation (VXI bus). General technical requirements
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Shunt power capacitors of the non-self-healing type for a.c. systems having a rated voltage up to and including 1000 V. Part 2. Ageing test and destruction test
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Field-effect transistors. Drain residual current measurement technique
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Low powered electronic tubes. Method for measurement of the temperature of the bulb
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Information technology. Open systems interconnection. Application layer structure
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