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Nanomanufacturing - Key control characteristics - Part 6-14- Graphene-based material - Defect level- Raman spectroscopy. IEC TS 62607-6-14:2020-10(en). Original standard IEC TS 62607-6-14-2020 in PDF full version. Additional info + preview on request

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Nanomanufacturing - Key control characteristics - Part 6-16- Two-dimensional materials - Carrier concentration- Field effect transistor method. IEC TS 62607-6-16:2022-11(en). Original standard IEC TS 62607-6-16-2022 in PDF full version. Additional info + preview on request

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Nanomanufacturing - Key control characteristics - Part 6-17- Graphene-based material - Order parameter- X-ray diffraction and transmission electron microscopy. IEC TS 62607-6-17:2023-05(en). Original standard IEC TS 62607-6-17-2023 in PDF full version. Additional info + preview on request

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Nanomanufacturing - Key control characteristics - Part 6-18- Graphene-based material - Functional groups- TGA-FTIR. IEC TS 62607-6-18:2022-12(en). Original standard IEC TS 62607-6-18-2022 in PDF full version. Additional info + preview on request

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Nanomanufacturing - Key control characteristics - Part 6-19- Graphene-based material - Elemental composition- CS analyser, ONH analyser. IEC TS 62607-6-19:2021-10(en). Original standard IEC TS 62607-6-19-2021 in PDF full version. Additional info + preview on request

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Nanomanufacturing - Key control characteristics - Part 6-2- Graphene - Number of layers- atomic force microscopy, optical transmission, Raman spectroscopy. IEC TS 62607-6-2:2023-04(en). Original standard IEC TS 62607-6-2-2023 in PDF full version. Additional info + preview on request

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